| MODEL NO. |
DESCRIPTION |
US$ PRICE |
Meiji ML6520
Meiji
ML6520 Transmitted light binocular microscope with DIN standard eyepiece
HWF 12.5X and HWF12.5X focusing eyepiece with Walton Beckett reticle (Type
G-22 with
3:1
aspect ratio).
Quadruple nosepiece with SM Plan DIN brightfield objectives 10X, and
BF
S. Plan Achromat Positive Phase contrast objective 40XS/N.A. 0.65
Mechanical X-Y stage with attached finger assembly
Achromatic condenser NA 1.25 with Iris, filter tray and centerable 40X
positive
phase
annulus in sliding mount.
Coaxial coarse and fine focus adjustment with graduation, reading 2 microns
per
division
with tension adjustment and auto safety focus stop.
Built-in Koehler illuminator with 6V 30W halogen lamp & variable intensity
control.
GIF (Green interference filter) 546nm, 29.8mm diameter
Centering telescope
Stage micrometer 1mm divided into 100 units (each division = 0.01mm)
Supplied with dust cover and operations manual in styrofoam case. |
Meiji ASBESTOS PLM
MICROSCOPES |
1,900.00 |
Meiji ML6530
Same as Meiji ML6520 but with trinocular head with beam-splitter |
Meiji ASBESTOS PLM
MICROSCOPES |
2,100.00 |
Meiji ML6510
Same as Meiji ML6520 but with monocular head |
Meiji ASBESTOS PLM
MICROSCOPES |
1,500.00 |
COMPONENTS
& ACCESSORIES FOR Meiji ML6500
SERIES Microscopes
VIEWING
HEADS
MA602
Inclined binocular head 520.00
MA603
Inclined trinocular head 710.00
MA403
Incinced monocular head 135.00
EYEPIECES
MA489
DIN HWF 12.5 X eyepiece, FN 15mm (ea) 60.00
MA488W
DIN focusing HWF 12.5 X eyepiece with Walton & Beckett reticle 147.00
EYEPIECE
MICROMETER
MA254
Walton & Beckett reticle, 19mm diameter, 3:1 aspect ratio 29.00
BRIGHTFIELD
OBJECTIVES
MA613
10X/0.25 SM Semi Planachromat objective, W.D. 6.23mm 80.00
MA614
20X/0.40 SM Semi Planachromat objective, spring loaded, W.D. 3.13mm 110.00
PHASE
OBJECTIVE
MA698
BF S. Plan Achromat Phase objective 40XS/N.A. 0.65 300.00
PHASE
- CENTERING TELESCOPE
MA458
Centering telescope 110.00
PHASE
CONDENSER & GIF
MA461/05
Achromatic condenser N.A. 1.25 with iris diaphragm, filter tray and 297.00
non-centerable
40X phase annulus in sliding mount. (Optional)
MA461/10
Achromatic condenser N.A. 1.25 with iris diaphragm, filter tray and 335.00
centerable
40X phase annulus in sliding mount. (Included)
MA759
GIF (Green interference filter 546nm, 29.8mm diameter) 78.00
STAGE
MICROMETER
MA285
Stage micrometer, 1mm divided into 100 units (Each division = 0.01mm) 50.00
MISCELLANEOUS
MA609/05
Wooden cabinet with lock and key for ML6500 series 160.00
MA326
Spare halogen bulb 6V 30W 20.00
MA327
Fuse 3A 1.00
MA712
Dust cover for ML6500 Series 5.00
ASBESTOS
I.D. BY PLM (POLARIZED LIGHT MICROSCOPY)
FOR
BULK FIBER IDENTIFICATION
METHODOLOGY
FOR PLM ANALYSIS: NIOSH 9002
THIS
METHOD IS USEFUL FOR THE QUALITATIVE IDENTIFICATION OF ASBESTOS AND THE
SEMI-QUANTATIVE DETERMINATION OF ASBESTOS IN BULK SAMPLES. THIS METHOD
MEASURES THE PERCENTAGE OF ASBESTOS AS PERCEIVED BY THE ANALYST IN COMPARISON
TO STANDARD PROJECTIONS, PHOTOGRAPHS OR EXPERIENCE. THE
QUALITY
OF THE RESULTS ARE DEPENDENT UPON THE SKILL AND JUDGEMENT OF THE OPERATOR.
REQUIRED
MICROSCOPE EQUIPMENT:
POLARIZED
LIGHT MICROSCOPE 100 X-400 X WITH 10 X DISPERSION STAINING (CENTRAL STOP)
OBJECTIVE STEREO MICROSCOPE 10 X - 45 X
ASBESTOS
FIBER COUNTING BY PCM (PHASE CONTRAST MICROSCOPY)
METHODOLOGY
FOR PCM ANALYSIS: NIOSH 7400 & OSHA ID 160
PHASE
CONTRAST MICROSCOPY IS THE METHOD THAT IS PRIMARILY USED FOR ESTIMATING
ASBESTOS CONCENTRATIONS OF AIRBORNE FIBERS. THIS METHOD IS QUICK AND CAN
BE PERFORMED ON-SITE FOR A
RAPID
DETERMINATION OF CONCENTRATIONS OF ASBESTOS FIBERS IN THE AIR. PHASE CONTRAST
MICROSCOPY DOES NOT POSITIVELY DIFFERENTIATE BETWEEN ASBESTOS AND OTHER
FIBERS. POSITIVE IDENTIFICATION OF ASBESTOS FIBER MUST BE PERFORMED USING
PLM OR ELECTRON MICROSCOPY (METHOD 7402)
REQUIRED
MICROSCOPE EQUIPMENT:
POSITIVE
PHASE CONTRAST MICROSCOPE WITH 10X BRIGHTFIELD AND 40X PHASE OBJECTIVE,
GIF (GREEN INTERFERENCE FILTER), WALTON & BECKETT RETICLE TYPE-22G
, AND STAGE MICROMETER WITH 0.01MM DIVISIONS.
REQUIRED
TEST SLIDE: THE HSE/NPL MARK II PHASE SHIFT TEST SLIDE CHECKS OR STANDARDIZES
THE VISUAL DETECTION LIMITS OF THE PHASE CONTRAST MICROSCOPE. THE HSE/NPL
TEST SLIDE CONSISTS OF A CONVENTIONAL GLASS MICROSCOPE SLIDE WITH SEVEN
SETS OF PARALLEL LINE PAIRS OF DECREASING WIDTHS. THE MICROSCOPE MUST CLEARLY
RESOLVE LINE PAIRS 1-3. LINE PAIRS 4-5 MUST BE AT LEAST PARTIALLY VISIBLE.
LINE PAIRS 6-7 MUST BE INVISIBLE. A MICROSCOPE WHICH FAIL TO MEET THESE
REQUIREMENTS IS EITHER TOO LOW OR HIGH IN RESOLUTION AND CANNOT BE USED
FOR ASBESTOS IDENTIFICATION.
BASIC
POLARIZED LIGHT MICROSCOPY TERMINOLOGY
COMPENSATORS
& RETARDATION PLATES
Polarized
Light microscopy is a useful tool for distinguishing between singly refracting
(optically isotropic) and doubly refracting (optically anisotropic) material.
Quantitative measurements of optical anisotrophy is used in the optical
analysis of doubly refracting or birefringent materials under polarized
light. These measurements are made with the aid of accessory plates called
compensators and retardation plates. Retardation plates have a fixed optical
path difference and compensators have a variable optical path difference.
The intermediate tube of the Meiji polarized light microscope houses either
sliding or rotatable analyzer, a sliding Bertrand lens and a slot for insertation
of retardation plates and compensators. The dimensions of the compensator/retardation
plate are DIN standard 20mm X 6mm.
QUARTER
WAVE-PLATE - The quarter wave length retardation plate is a thin slice
of birefringent material (e.g. mica) cut to a thickness to give 1/4 
optical path difference (OPD)in yellow light of about 145nm. The quarter
wave-plate changes linear or plane polarized light into circularly polarized
light. The quarter wave-plate is useful for qualitative analysis of orthoscopic
and conescopic images. The quarter wave plate is also used for assessment
of optical path differences in birefringent specimens. 1/4
plate 145nm
FIRST
ORDER RED PLATE - The first order retardation plate is a thin slice
of birefringent material (e.g. gypsum) cut to a thickness to give 1
optical path difference (OPD) for green light. The first order red plate
is frequently used to determine the optical sign (positive or negative)
of a birefrigent specimen and is also utilized for contrast enhancement
in weakly birefringent specimens. The first order red plate produces an
interference color having a typical tint of the first order red. The first
order red plate is known by several names, including: gypsum plate, lambda
plate, sensitive tint plate, and full wave plate. 1
plate = 550nm
QUARTZ
WEDGE - The quartz wedge is a variable compensator which is designed
to produce a range of retardation values as the wedge is moved in and out
of the optical path. The thin edge of the wedge produces an optical path
difference of zero. The optical path difference increases with increasing
thickness of the wedge. Each separate wavelength in the spectrum produces
a series of dark extinction bands of which the OPD is exactly one wavelength
apart. Specimen retardation values can be determined by observing changes
in the polarization properties of birefringent specimens as the wedge thickness
in the light path varies. Meijis quartz wedge permits retardation measurements
from 1-6 wavelengths.
SENARMONT
COMPENSATOR - The Senarmont compensator is useful tool for
measurement
of retardation levels of crystals, living organisms and also for measuring
permanent stresses in clear materials. The Senarmont compensator is also
used for image contrast enhancement of weakly birefringent specimens.
ANALYZER
- A polar place in the light path after the specimen. The analyzer is removable
from the light path and may be rotatable. The analyzer is used to determine
the optical effects produced by the specimen either in plane or polarized
light.
BERTRAND
LENS - The Bertrand lens is located above the analyzer. The eyepiece
and Bertrand lens act as a system to focus on the back image plane of the
objective. The Bertrand lens main function is to view interference figures
(conoscopic images) which appear in the back image plane of the objective
when the specimen is viewed between crossed polars using highly convergent
light from the condenser.
BIREFRINGENCE
- A quantitative expression of the separation of a light beam as it penetrates
a doubly refracting object into two diverging beams..
CONOSCOPIC
FIGURE - A pattern consisting of isogyres and/or isochromatic curves
formed in the back image plane of the objective also referred to as an
interference figure.
CONOSCOPIC
OBSERVATION - Observation of the conoscopic or interference figure
by means of a Bertrand lens.
PLANE-POLARIZED
LIGHT - Light with only one vibration direction present.
PLEOCHROISM
- A property exhibited by certain crystals of absorbing selectively various
wavelengths of light and of displaying different colors when looked at
in the directions of their various crystal axes.
POLAR
- A device which produces plane polarized light from natural light.
POLARIZER
- A polar placed in the light path before the specimen.
STRAIN
FREE - A term used to signify that microscope objectives and condenser
lenses are selected to have a minimum amount of internal stress in the
glass. Strain free optics offers little or no contribution to the optical
path difference of the specimen.
